Abbate, Carolyn & Parker, RogerBiblio.com
26 résultats
2003OP-49New York: John Wiley & Sons 2003. Comprehensive advanced reference text contains detailed sections on interpretation of IR spectra of ultrathin fims optimum conditions for recording IR spectra of ultrathin films equipment and techniques infrared spectroscopy of thin layers in silicon micrelectronics application of infrared spectroscopy to analysis of interfaces and thin dielectric layers in semiconductor technology; etc. 710 pgs. Illustrated. Heavy Item. First Edition. Hard Cover. As New. 4to - over 9¾" - 12" tall. John Wiley & Sons Hardcover